Professional Experience
July 2014 – Present: Professor, Dept. of Electronics, Beijing Normal University, China. Research Field: Transistor-level Low power design.
Sept. 2005 – June 2014: Associate professor, Dept. of Electronics, Beijing Normal University, China. Research Field: Transistor-level Low power design.
Sept. 2004 – Aug. 2005: Post Doctoral Researcher, Department of ECE, Toronto University, Ontario, Canada. Research Field: Transistor-level Low power design.
Sept. 2002 – Aug. 2004: Post Doctoral Researcher, Department of Computer, Tsinghua University, Beijing, China. Research Field: Power/Ground grid simulation and optimization. Low power design and Power estimation.
May. 1999 – July.2002: Ph. D. Candidate, Department of Automation, Tsinghua University, Beijing, China. Major: Integrated circuit design and testing. Degree: Doctor of Engineering.
Apr. 1992 – May 1999: Engineer, Institute of Metallurgy Automation, the Ministry of Metallurgy, Beijing, China. Research: Automation Engineering.
Education
Sept., 1989 – Mar. 1992: Graduate student, Dept. of Precision Instrument, Tianjin University, Tianjin, China. Major: measuring & testing technology and instrument. Degree: Master of Engineering.
Sept., 1985 — July, 1989: Undergraduate student, Dept. of Precision instrument, Tianjin University, Tianjin, China. Degree: Bachelor of Engineering.
Teaching
Integrate Circuit Design, Super-Large Scale Circuit Design.
Research Interests
Transistor-level Low power design.
Selected Publications
[1] “Algorithm study on statistic electro-thermal analysis for high performance chips based on single-node SOR method”. National Natural Science Foundation of China, No. 60876025, 2009-2011.
[2] “Study on key low-power running techniques in multi-processor system-on-chip”. Hi-Tech Research & Development (863) Program of China 2009AA01Z126, 2009-2011.
[3] Intel Founding. “Algorithm study on P/G grid analysis and optimization”.
[4] Chinese Post-doctoral foundation, “The algorithm study on fast estimating the leakage current of multi-Threshold CMOS circuits”. No.023250003.
[5] National Natural Science Foundation of China (NSFC) 60121120706 and National Natural Science Foundation of USA (NSF) CCR-0096383.
[6] Hi-Tech Research & Development (863) Program of China 2002AA1Z1460.
[7] The National Fundamental Research (973) Program of China G1998030403.
[8] “Hardware Software Co-Design for Low-Power System”. Hi-Tech Research & Development (863) Program of China 2002AA111070, 2002-2006.
[9] “Design Verification and Test Generation from Behavioral Level to Layout Level”, National Natural Science Foundation of China, No. 90207002, 2003-2005.
[10] “Study on Basic Techniques of fault toleration and computing”. National Natural Science Foundation of China, No. 69733010, 1999-2002.
[11] Project manager, “a instrument system measuring hot-bar diameter with photogrammetry”, granted by National Natural Science Foundation of China, No. 29012317, 1990-1992.
[12] Principal Investigator, “Hot-bar diameter measuring instrument”, Department of Precision instrument, Tianjin University. 1988-1990.
Contacts
Tel: 8610-58800443
Email: luozy@bnu.edu.cn