Professional Experience

July 2014 – Present: Professor, Dept. of Electronics, Beijing Normal University, China. Research Field: Transistor-level Low power design.

Sept. 2005 – June 2014: Associate professor, Dept. of Electronics, Beijing Normal University, China. Research Field: Transistor-level Low power design.

Sept. 2004 – Aug. 2005: Post Doctoral Researcher, Department of ECE, Toronto University, Ontario, Canada. Research Field: Transistor-level Low power design.

Sept. 2002 – Aug. 2004: Post Doctoral Researcher, Department of Computer, Tsinghua University, Beijing, China. Research Field: Power/Ground grid simulation and optimization. Low power design and Power estimation.

May. 1999 – July.2002: Ph. D. Candidate, Department of Automation, Tsinghua University, Beijing, China. Major: Integrated circuit design and testing. Degree: Doctor of Engineering.

Apr. 1992 – May 1999: Engineer, Institute of Metallurgy Automation, the Ministry of Metallurgy, Beijing, China. Research: Automation Engineering.

Education

Sept., 1989 – Mar. 1992: Graduate student, Dept. of Precision Instrument, Tianjin University, Tianjin, China. Major: measuring & testing technology and instrument. Degree: Master of Engineering.

Sept., 1985 — July, 1989: Undergraduate student, Dept. of Precision instrument, Tianjin University, Tianjin, China. Degree: Bachelor of Engineering.

Teaching

Integrate Circuit Design, Super-Large Scale Circuit Design.

Research Interests

Transistor-level Low power design.

Selected Publications

[1]  “Algorithm study on statistic electro-thermal analysis for high performance chips based on single-node SOR method”. National Natural Science Foundation of China, No. 60876025, 2009-2011.

[2]  “Study on key low-power running techniques in multi-processor system-on-chip”. Hi-Tech Research & Development (863) Program of China 2009AA01Z126, 2009-2011.

[3]  Intel Founding. “Algorithm study on P/G grid analysis and optimization”.

[4]  Chinese Post-doctoral foundation, “The algorithm study on fast estimating the leakage current of multi-Threshold CMOS circuits”. No.023250003.

[5]  National Natural Science Foundation of China (NSFC) 60121120706 and National Natural Science Foundation of USA (NSF) CCR-0096383.

[6]  Hi-Tech Research & Development (863) Program of China 2002AA1Z1460.

[7]  The National Fundamental Research (973) Program of China G1998030403.

[8]  “Hardware Software Co-Design for Low-Power System”. Hi-Tech Research & Development (863) Program of China 2002AA111070, 2002-2006.

[9] “Design Verification and Test Generation from Behavioral Level to Layout Level”, National Natural Science Foundation of China, No. 90207002, 2003-2005.

[10] “Study on Basic Techniques of fault toleration and computing”. National Natural Science Foundation of China, No. 69733010, 1999-2002.

[11]  Project manager, “a instrument system measuring hot-bar diameter with photogrammetry”, granted by National Natural Science Foundation of China, No. 29012317, 1990-1992.

[12]  Principal Investigator, “Hot-bar diameter measuring instrument”, Department of Precision instrument, Tianjin University. 1988-1990.

Contacts

Tel: 8610-58800443

Email: luozy@bnu.edu.cn